Spi 40-247-9 Optical Comparator Chart Reticle 10x

Product Description

The SPI 40-247-9 is an optical comparator chart and reticle designed for use with 10x magnification comparator systems. The reticle measures 1.375 inches in overall diameter and serves as a precision measurement overlay for optical comparators used in inspection and quality control applications. This type of reticle is placed in the optical path of the comparator, allowing the operator to compare a projected part profile against reference lines, angles, or radii etched on the glass or film chart surface. It is a consumable or replacement optical accessory used by quality control technicians and machinists in manufacturing and inspection environments.

This reticle is suited for bench-top optical comparator stations in manufacturing shops, machine shops, and quality control labs. It is intended for use specifically with comparator systems running 10x magnification optics. Applications include dimensional inspection of small machined parts, tool geometry verification, thread profile checking, and form tolerance inspection where projected magnification is the measurement method.

Key Features

• Designed for 10x magnification optical comparator systems
• 1.375-inch overall diameter fits standard comparator reticle holders
• Provides a reference overlay for dimensional and profile inspection
• Sold individually as a single-unit replacement or spare

Compatibility

Designed for use with optical comparator systems operating at 10x magnification that accept a 1.375-inch diameter reticle or chart insert.

Installation Notes

Reticle installation is performed by quality control technicians or metrologists familiar with optical comparator maintenance. Power down or disable the comparator light source before accessing the optical stage or reticle housing to avoid glare or heat exposure. Handle the reticle only by its edges to avoid contaminating the optical surface. Consult the comparator manufacturer's service documentation for proper seating and orientation procedures specific to the instrument model in use.