Spi CMS160412010 Outside Micrometer 0.01 in Graduation

Product Description

The SPI CMS160412010 is a mechanical outside micrometer designed for precise linear measurement in machining, metalworking, and inspection applications. It features a ratchet stop thimble for consistent measuring pressure and a rotating spindle for smooth, repeatable contact. Graduation is 0.01 inches, with an accuracy of 0.004 mm. The measuring faces are solid carbide for durability under regular shop use. A built-in digital counter assists with fast, clear reading. The micrometer ships NIST-traceable calibrated and includes a short-form certificate of calibration, making it ready for quality-controlled environments.

This outside micrometer is suited for dimensional inspection work in manufacturing, tool and die, and precision machining shops. It is a standard tool for machinists, quality control technicians, and metrologists who require verified, traceable measurement results. The satin chrome coating reduces glare and provides corrosion resistance in typical shop conditions. Each unit ships individually packaged and includes a protective case and calibration documentation.

Key Features

• 0.01 inch graduation for precise outside diameter and linear measurements
• Ratchet stop thimble provides consistent, repeatable measuring force
• Solid carbide measuring faces for extended wear life
• Built-in digital counter for fast, clear reading
• NIST-traceable calibration included with short-form certificate of calibration
• Satin chrome finish reduces glare and resists corrosion

Compatibility

Designed as a standard mechanical outside micrometer for general-purpose precision measurement in machining and inspection environments.

Installation Notes

Outside micrometers do not require installation but should be stored in the included protective case when not in use to protect the measuring faces and thimble mechanism. Before use, verify the zero setting against a known standard and confirm the calibration certificate is current for your quality system requirements. Avoid dropping or stacking the instrument, as impact can affect calibration. Recalibration should be performed per your facility calibration schedule or any time the instrument is suspected of sustaining damage.